Why Instrument Detection Limit (IDL) is a Better Metric for Determining The Sensitivity of Triple Quadrupole LC/MS Systems
Technické články | 2014 | Agilent TechnologiesInstrumentace
LC/MS, LC/MS/MS, LC/QQQ
ZaměřeníVýrobceAgilent Technologies
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Technical Overview Instrument Detection Limit at Ultrashort Dwell Times Demonstrated on the Agilent 6495C Triple Quadrupole LC/MS Authors Charles Nichols, Behrooz Zekavat, and Patrick Batoon Agilent Technologies, Inc. Abstract This Technical Overview presents the measurement of the instrument detection limit…
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Why use Signal-To-Noise as a Measure of MS Performance When it is Often Meaningless? Technical Overview Authors Abstract Greg Wells, Harry Prest, and The signal-to-noise of a chromatographic peak determined from a single measurement Charles William Russ IV, has served…
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Sensitivity and acquisition speed with triple quadrupole technology
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