Improving UV-Vis Efficiency with Simultaneous Data Collection

Sample throughput can be one of the most challenging aspects of using a UV-VIS Spectrometer. Scanning spectrometers are capable of collecting data extremely quickly but overall, certain measurements, like kinetics and thermal melts, can still be bottlenecked by the need to measure one sample at a time.

We will discuss in this webinar what to do in these scenarios - and how simultaneous data collection can speed up sample throughput and improve workflows.

Presenter: Scott Melis, PhD (Application Scientist, Agilent Technologies, Inc.)

Scott Melis has a PHD in Physics from Georgetown University in Washington, DC and started with Agilent in 2021 as a Molecular Spectroscopy Application Scientist. In his graduate work, Scott studied nanoparticle formation and growth for a variety of applications. Projects that he worked with include developing processes to deposit and characterize semiconducting molecular nano-cocrystals for use in optoelectronic devices as well as controlling polymer nanoparticle size through rapid mixing conditions.